NANOSCALE TOPOGRAPHY AND SPATIAL LIGHT MODULATOR CHARACTERIZATION USING WIDE-FIELD QUANTITATIVE PHASE IMAGING

Gannavarpu Rajshekhar,1 Basanta Bhaduri,1 Chris Edwards,2 Renjie Zhou,2 Lynford L. Goddard,2 and Gabriel Popescu1,
OPTICS EXPRESS 3432, Vol. 22, No. 3 2014

 

We demonstrate an optical technique for large field of view quantitative phase imaging of reflective samples. It relies on a common-path interferometric design, which ensures high stability without the need for active stabilization. The technique provides single-shot, full-field and robust measurement of nanoscale topography of large samples. Further, the inherent stability allows reliable measurement of the temporally varying phase retardation of the liquid crystal cells, and thus enables real-time characterization of spatial light modulators. The technique’s application potential is validated through experimental results.

Scroll to top
Phi Optics
Privacy Overview

This website uses cookies so that we can provide you with the best user experience possible. Cookie information is stored in your browser and performs functions such as recognising you when you return to our website and helping our team to understand which sections of the website you find most interesting and useful.