About Phi Optics

Phi Optics combines phase imaging with low-coherence interferometry and holography in a common-path geometry. Phase imaging microscopes (phase contrast, DIC, diffraction phase) employ regular white light (low-coherence) and provide 2 illumination beams. The beams pass through the same optical elements from sample plane to the camera plane. The beams superposition is measured in every pixel (common-path interferometry) and provides high signal to noise ratio (nanometer phase sensitivity). The direct quantitative phase map of the specimen (holography) is then recovered: pixel intensity in a QPI image is a local measurement of the phase shift (in radians). This phase map can be converted to local thickness, refractive index and dry mass maps of the specimen.

CellVista SLIM™ & CellVista GLIM™ seamlessly upgrade commercial microscopes (Zeiss, Nikon, Leica, Olympus) with any magnification available (immersion or dry). Either module connects to the imaging port of a microscope. Samples load into standard holders (glass slides, single, multi-well plates) and fields of view are limited only by the microscope stage movement. Phi Optics modules use the same camera for all channels of imaging from the microscope therefore insuring seamless overlays. High end sCMOS cameras provide high sensitivity fluorescence co-localization. Any fluorescence channels present on the microscope can be used for imaging.