Live cell imaging 3

Live cell imaging

 

label-free
non-invasive

 
 
 
 

Z. Wang et al., Opt. Exp. (2011); R. Wang et al., Opt. Exp. (2011)

  More publications

Live cell imaging 2

Live cell imaging

 

label-free
non-invasive

 
 
 
 

Z. Wang et al., Opt. Exp. (2011); R. Wang et al., Opt. Exp. (2011)

  More publications

Biopsy diagnosis 2

Biopsy diagnosis

 

label-free
objective

 
 
 
 
 

Z. Wang et al., J. Biomed. Opt. (2011)

  More publications

Cell growth 2

Cell growth

 

quantify dry mass
femtogram accuracy

 
 
 
 
 

M. Mir et al., Proc. Nat. Acad. Sci. (2011)

  More publications

Live cell imaging

Live cell imaging

 

label-free
non-invasive

 
 
 
 

Z. Wang et al., Opt. Exp. (2011); R. Wang et al., Opt. Exp. (2011)

  More publications

Blood testing

Blood testing

 

label-free
real-time

 
 
 
 
 

H. Pham et al. PLoS One (2013)

  More publications

Live cell tomography

Live cell tomography

 

label-free
non-invasive

 
 
 
 

Z. Wang et al., Opt. Exp. (2011); M. Mir, PLoS One (2012)

  More publications

Etching monitoring

Etching monitoring

 

real-time
nanometer accuracy

 
 
 
 
 

C. Edwards et al., Light Sci. Appl. (2012)

  More publications

Cell Growth

Cell Growth

 

quantify dry mass
femtogram accuracy

 
 
 
 
 

M. Mir et al., Proc. Nat. Acad. Sci. (2011)

  More publications

Topography

 

fast
nanometer accuracy

 

Z. Wang et al., Opt. Exp. (2011)
More publications

Blood Testing

 

label-free
real-time

 

H. Pham et al. PLoS One (2013)
More publications

Biopsy Diagnosis

 

label-free
objective

 

Z. Wang et al., J. Biomed. Opt. (2011)
More publications

Applications

Life Sciences

QPI enables the biomedical investigator to quantify dynamically live samples

Clinical Diagnostics

QPI can provide high throughput blood screening on a number of diseases, including various anemias and malaria.

Nanotechnology

QPI is an excellent platform for imaging of nanofabricated structures.

Semiconductor Industry

QPI is an excellent tool for non-destructive investigation of defects in a wafer or semiconductor devices